A model of the reflection distribution in the vacuum ultra violet region

作者：Silva C^*; Pinto da Cunha J; Pereira A; Lopes M I; Chepel V; Solovov V; Neves F

来源：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment , 2010, 619(1-3): 59-62.

DOI：10.1016/j.nima.2009.10.086

• Xenon scintillation
• Reflectance
• VUV
• PTFE
• Rough surfaces
• Diffuse
• Reflection

A reflection model with three components, a specular spike, a specular lobe and a diffuse lobe is discussed. This model was successfully applied to describe reflection of xenon scintillation light (lambda = 175 nm) by PTFE and other fluoropolymers and can be used for Monte Carlo simulation and analysis of scintillation detectors. The measured data favor a Trowbridge-Reitz distribution function of ellipsoidal micro-surfaces. The intensity of the coherent reflection increases with increasing angle of incidence, as expected, since the surface appears smoother at grazing angles. The total reflectance obtained for FIFE is about 70% for VUV light at normal incidence in vacuum and estimated to go up to 100% in contact with liquid xenon, depending of the angle.

• 出版日期2010-7-1