A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation

作者：Benfica Juliano; Bolzani Poehls Leticia Maria; Vargas Fabian; Lipovetzky Jose; Lutenberg Ariel; Gatti Edmundo; Hernandez Fernando

来源：Journal of Electronic Testing-Theory and Applications, 2012, 28(6): 803-816.

DOI：10.1007/s10836-012-5334-z

• System-on-Chip
• Electromagnetic Interference
• Total-Ionizing Dose Radiation
• Testing Platform

With the IEC 62.132 proposal, the roadmap for standardization of Electromagnetic (EM) immunity measurement methods has reached a high degree of success. The same understanding can be taken from the MIL-STD-883 H for Total Ionizing Dose (TID) radiation. However, no effort has been made to measure the behavior of electronics operating under the combined effects of both, EM noise and TID radiation. For the reasons pointed out, the combined-effect measurements should be mandatory when dealing with Systems-on-Chip (SoCs) devoted to critical applications. In this paper, we present a configurable platform devoted to perform combined tests of EM immunity and TID radiation of SoCs according to the international standards.

• 出版日期2012-12