Artefacts in geometric phase analysis of compound materials

作者：Peters Jonathan J P^*; Beanland Richard; Alexe Marin; Cockburn John W; Revin Dmitry G; Zhang Shiyong Y; Sanchez Ana M

来源：Ultramicroscopy, 2015, 157: 91-97.

DOI：10.1016/j.ultramic.2015.05.020

• Geometric phase analysis (GPA)
• Interfaces
• Scanning transmission electron microscopy (STEM)
• Strain

The geometric phase analysis (GPA) algorithm is known as a robust and straightforward technique that can be used to measure lattice strains in high resolution transmission electron microscope (TEM) images. It is also attractive for analysis of aberration-corrected scanning TEM (ac-STEM) images that resolve every atom column, since it uses Fourier transforms and does not require real-space peak detection and assignment to appropriate sublattices. Here it is demonstrated that, in ac-STEM images of compound materials with compositionally distinct atom columns, an additional geometric phase is present in the Fourier transform, lithe structure changes from one area to another in the image (e.g, across an interface), the change in this additional phase will appear as a strain in conventional GPA, even if there is no lattice strain. Strategies to avoid this pitfall are outlined.

• 出版日期2015-10