A high-resolving-power x-ray spectrometer for the OMEGA EP Laser

作者：Nilson P M^*; Ehrne F; Mileham C; Mastrosimone D; Jungquist R K; Taylor C; Stillman C R; Ivancic S T; Boni R; Hassett J; Lonobile D J; Kidder R W; Shoup M J III; Solodov A A; Stoeckl C; Theobald W; Froula D H; Hill K W; Gao L; Bitter M; Efthimion P; Meyerhofer D D

来源：Review of Scientific Instruments, 2016, 87(11): 11D504.

DOI：10.1063/1.4961076

A high-resolving-power x-ray spectrometer has been developed for the OMEGA EP Laser System based on a spherically bent Si [220] crystal with a radius of curvature of 330 mm and a Spectral Instruments (SI) 800 Series charge-coupled device. The instrument measures time-integrated x-ray emission spectra in the 7.97- to 8.11-keV range, centered on the Cu K-alpha 1 line. To demonstrate the performance of the spectrometer under high-power conditions, K-alpha 1,K-2 emission spectra were measured from Cu foils irradiated by the OMEGA EP laser with 100-J, 1-ps pulses at focused intensities above 10(18) W/cm(2). The ultimate goal is to couple the spectrometer to a picosecond x-ray streak camera and measure temperature-equilibration dynamics inside rapidly heated materials. The plan for these ultrafast streaked x-ray spectroscopy studies is discussed. Published by AIP Publishing.

• 出版日期2016-11
• 单位Los Alamos