摘要

We present a sensor system that determines if the circuit current-temperature (I - T) dependence is positive or negative. While prior temperature sensors can prevent overheating and temperature-induced timing failures in systems with negative I - T dependences, the proposed sensor system can prevent these issues in systems with negative or positive I - T dependences. This capability will become increasingly critical as technology scaling results in positive I - T dependences occurring at near-nominal operating voltages. The fabricated sensor system occupies < 0.05 mm(2), consuming 310 nJ per sample with 20-mu s latency in 0.35-mu m technology. A process variation compensation unit is presented for the calibration of the temperature sensor, which has a temperature nonlinearity of as low as 0.2%. Sensor functionality is verified over a temperature range of 5 degrees C-80 degrees C and a voltage range of 0.6-3.3 V. The system is shown to achieve this improved functionality while maintaining comparable area, energy, and accuracy with alternative temperature sensor designs.

  • 出版日期2011-4