Nanoscale Mapping of Electrical Resistivity and Connectivity in Graphene Strips and Networks

作者：Nirmalraj Peter N; Lutz Tarek; Kumar Shishir; Due**erg Georg S; Boland John J^*

来源：Nano Letters, 2011, 11(1): 16-22.

DOI：10.1021/nl101469d

• Grapherne resistivity
• interflake resistance
• conductance imaging atomic force microscopy (CI-AFM)

In this article we map out the thickness dependence of the resistivity of individual graphene strips, from single layer graphene through to the formation of graphitic structures. We report exceptionally low resistivity values for single strips and demonstrate that the resistivity distribution for single strips is anomalously narrow when compared to bi- and trilayer graphene, consistent with the unique electronic properties of single graphene layers. In agreement with theoretical predictions, we show that the transition bulk like resistivities occurs at seven to eight layers of graphene. Moreover, we demonstrate that the contact resistance between graphene flakes in a graphene network scales with the flake thickness and the implications of transparent conductor applications are discussed.

• 出版日期2011-1