Asymmetry and Switching Phenomenology in TiN\(Al2O3)\HfO2\Hf Systems

作者：Goux L^*; Fantini A; Govoreanu B; Kar G; Clima S; Chen Y Y; Degraeve R; Wouters D J; Pourtois G; Jurczak M

来源：ECS Solid State Letters, 2012, 1(4): P63-P65.

DOI：10.1149/2.003204ssl

In this letter, we address the bipolar resistive switching phenomenology in scaled TiN\HfO2\Hf cells. By means of stack engineering using a thin Al2O3 layer inserted either at the TiN\HfO2 or at the Hf\HfO2 interface, we demonstrate that the reset operation takes place close to the TiNanode. Due to the increase of the oxygen-vacancy profile from the TiN to the Hf interface, the filament-confining and wide band-gap Al2O3 layer should indeed be engineered at the interface with the TiN electrode in order to further improve the switching control and to allow reaching larger state resistances.

• 出版日期2012