摘要

We present direct measurements of the kinetics of surface relief gratings (SRGs) formation in amorphous As20Se80 thin films observed in real time by in situ atomic force microscopy. SRGs are induced in different holographic schemes of recording using near band-gap light and enhanced additionally by light polarized orthogonally to the recording beams. We demonstrate that the direction of mass transport depends on the polarization of additional light and recording pattern and can be driven by their modulation. Additional light triggers a giant mass transport and accelerates SRG formation while increasing it in height up to the order of the film thickness.

  • 出版日期2010-7-19