Modeling of Electrolyte Thermal Noise in Electrolyte-Oxide-Semiconductor Field-Effect Transistors

作者：Park Chan Hyeong; Chung In Young^*

来源：Journal of Semiconductor Technology and Science, 2016, 16(1): 106-111.

DOI：10.5573/JSTS.2016.16.1.106

• Thermal noise
• electrolyte
• oxide
• semiconductor
• field-effect
• transistors

Thermal noise generated in the electrolyte is modeled for the electrolyte-oxide-semiconductor field-effect transistors. Two noise sources contribute to output noise currents. One is the thermal noise generated in the bulk electrolyte region, and the other is the thermal noise from the double-layer region at the electrolyte-oxide interface. By employing two slightly-different equivalent circuits for two noise current sources, the power spectral density of output noise current is calculated. From the modeling and simulated results, the bulk electrolyte thermal noise dominates the double-layer thermal noise. Electrolyte thermal noise are computed for three different concentrations of NaCl electrolyte. The derived formulas give a good agreement with the published experimental data.

• 出版日期2016-2