Rietveld refinement of ternary compound Gd117Fe52Ge112

作者：He, Wei^*; Zhang, Jiliang; Zeng, Lingmin

来源：Powder Diffraction, 2007, 22(4): 312-315.

DOI：10.1154/1.2793073

• Gd117Fe52Ge112
• crystal structure
• Rietveld method
• X-ray diffraction data

A new ternary compound Gd117Fe52Ge112 has been successfully synthesized and studied by means of X-ray powder diffraction technique. Gd117Fe52Ge112 crystallizes in a cubic Tb117Fe52Ge112-type structure with space group Fm (3) over barm(#225) and lattice parameter a=28.7680(1) angstrom. Crystal structure of Gd117Fe52Ge112 has been successfully refined using the Rietveld method from X-ray diffraction data. The R-factors for the Rietveld refinement are R-p=0.099 and R-wp=0.128. X-ray powder diffraction data with the figure of merit F-30 of 80.4(30) are also reported.

• 出版日期2007-12
• 单位广西大学