Nanometer-Scale Infrared Spectroscopy of Heterogeneous Polymer Nanostructures Fabricated by Tip-Based Nanofabrication

作者：Felts Jonathan R; Kjoller Kevin; Lo Michael; Prater Craig B; King William P^*

来源：ACS Nano, 2012, 6(9): 8015-8021.

DOI：10.1021/nn302620f

• atomic force microscope
• AFM
• thermal dip-pen nanolithography
• tDPN
• AFM-IR
• photothermal induced resonance
• nanolithography
• tip based nanofabrication
• TBN

There is a significant need for chemical identification and chemical imaging of nanofabricated structures and devices, especially for multiple materials integrated at the nanometer scale. Here we present nanofabrication, chemical identification, and nanometer-scale chemical imaging of polymer nanostructures with better than 100 nm spatial resolution. Polymer nanostructures of polyethylene, polystyrene, and poly(3-dodecylthiophene-2,5-diyl) were fabricated by tip-based nanofabrication. Nanometer-scale infrared measurements using atomic force microscopy infrared spectroscopy (AFM-IR) obtained quantitative chemical spectra of these nanostructures. We show chemical imaging of intersecting patterns of nanometer-scale polymer lines of different chemical compositions. The results indicate that for closely packed heterogeneous nanostructures, the spatial resolution of AFM-IR is not limited by nanometer-scale thermal diffusion, but is instead limited by the cantilever sensitivity and the signal-to-noise ratio of the AFM-IR system.

• 出版日期2012-9