A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application

作者：Yan, Aibin; Yang, Kang; Huang, Zhengfeng; Zhang, Jiliang^*; Cui, Jie; Fang, Xiangsheng; Yi, Maoxiang; Wen, Xiaoqing

来源：IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2019, 66(2): 287-291.

DOI：10.1109/TCSII.2018.2849028

• Circuit reliability
• radiation hardening
• soft error
• double-node upset
• single node upset

This brief presents a double-node upset (DNU) self-recoverable latch design for high performance and low power application. The latch is mainly constructed from eight mutually feeding hack C-elements and any node pair of the latch is DNU self-recoverable. Using a high speed transmission path and a clock gating technique, the latch has high performance and low power dissipation. Simulation results demonstrate the DNU self-recoverability of the latch and also show that the delay-power-area product of the latch is improved approximately by 81.80% on average, compared with the latest DNU self-recoverable latch designs.

• 出版日期2019-2
• 单位安徽大学; 湖南大学; 合肥工业大学