Are electron tweezers possible?

作者：Oleshko Vladimir P^*; Howe James M

来源：Ultramicroscopy, 2011, 111(11): 1599-1606.

DOI：10.1016/j.ultramic.2011.08.015

• Electron tweezers
• Manipulation
• Nanoparticles
• Metal alloys
• Plasmons
• VEELS
• EFTEM

Positively answering the question in the title, we demonstrate in this work single electron beam trapping and steering of 20-300 nm solid Al nanoparticles generated inside opaque submicron-sized molten Al-Si eutectic alloy spheres. Imaging of solid nanoparticles and liquid alloy in real time was performed using energy filtering in an analytical transmission electron microscope (TEM). Energy-filtering TEM combined with valence electron energy-loss spectroscopy enabled us to investigate in situ nanoscale transformations of the internal structure, temperature dependence of plasmon losses, and local electronic and optical properties under melting and crystallization of individual binary alloy particles. For particles below 20 nm in size, enhanced vibrations of the dynamic solid-liquid interface due to instabilities near the critical threshold were observed just before melting. The obtained results indicate that focused electron beams can act as a tool for manipulation of metal nanoparticles by transferring linear and angular mechanical momenta. Such thermally assisted electron tweezers can be utilized for touchless manipulation and processing of individual nano-objects and potentially for fabrication of assembled nanodevices with atomic level sensitivity and lateral resolution provided by modern electron optical systems. This is by three orders of magnitude better than for light microscopy utilized in conventional optical tweezers. New research directions and potential applications of trapping and tracking of nano-objects by focused electron beams are outlined.

• 出版日期2011-11