Nanoscale mechanics by tomographic contact resonance atomic force microscopy

作者：Stan Gheorghe^*; Solares Santiago D; Pittenger Bede; Erina Natalia; Su Chanmin

来源：Nanoscale, 2014, 6(2): 962-969.

DOI：10.1039/c3nr04981g

We report on quantifiable depth-dependent contact resonance AFM (CR-AFM) measurements over polystyrene-polypropylene (PS-PP) blends to detail surface and sub-surface features in terms of elastic modulus and mechanical dissipation. The depth-dependences of the measured parameters were analyzed to generate cross-sectional images of tomographic reconstructions. Through a suitable normalization of the measured contact stiffness and indentation depth, the depth-dependence of the contact stiffness was analyzed by linear fits to obtain the elastic moduli of the materials probed. Besides elastic moduli, the contributions of adhesive forces (short-range versus long-range) to contact on each material were determined without a priori assumptions. The adhesion analysis was complemented by an unambiguous identification of distinct viscous responses during adhesion and in-contact deformation from the dissipated power during indentation.

• 出版日期2014