Different Dose Rate Radiation Effects on Linear CCDs

作者：Wang Zujun^*; Tang Benqi; Xiao Zhigang; Liu Minbo; Zhang Yong; Huang Shaoyan; Chen Wei; Liu Yinong

来源：IEEE Transactions on Nuclear Science, 2010, 57(3): 1626-1631.

DOI：10.1109/TNS.2010.2046751

• Charge coupled devices
• dark signal
• dose rate
• functional failure
• total ionizing dose

Charge coupled devices (CCD) have been tested at widely differing dose rates to examine the radiation tolerance dependence on the dose rates. The test results show a maximum tolerance of CCDs at 10.2 rad(Si)/sec, a slight reduction in tolerance at 34.8 rad(Si)/sec and a quite precipitous roll off when moving down to 1 rad(Si)/sec and 0.1 rad(Si)/sec. The degradation of the dummy output voltages and the dark signal voltages are compared at the dose rates of 0.1, 1.0, 10.2 and 34.8 rad(Si)/sec, respectively. It shows that the degradation levels depend on the dose rates. The CCDs are divided into two groups during Co-60 gamma irradiation. Either the output amplifiers or the photo sensing and the shift register areas are shielded with Pb during the irradiation tests.

• 出版日期2010-6
• 单位西北核技术研究所; 清华大学