Analysis of the Accuracy and Limitation of Contour Integral Equation Modeling of Planar Structures

作者:Li Kangning; Zhao Huapeng; Chen Zhizhang; Hu Jun
来源:Joint 60th IEEE International Symposium on Electromagnetic Compatibility (EMC) / IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), 2018-05-14 to 2018-05-18.

摘要

This paper presents the derivation of contour integral equation (CIE) modeling of planar structures based on field quantities and equivalence principle. It is shown that the CIE derived based on field quantities is essentially the same as the one derived based on voltages and currents. The derivation of CIE based on field quantities provides better understanding of the assumption of CIE, and thus allows easy analysis of the accuracy and limitation of CIE. Simulations are performed to evaluate the validity of the assumptions, and the accuracy of CIE is investigated.