A highly reliable butterfly PUF in SRAM-based FPGAs

作者：Xu, Xiumin; Liang, Huaguo; Huang, Zhengfeng^*; Jiang, Cuiyun; Ouyang, Yiming; Fang, Xiangsheng; Ni, Tianming; Yi, Maoxiang

来源：IEICE Electronics Express, 2017, 14(14): 20170551.

DOI：10.1587/elex.14.20170551

• physically unclonable PUF)
• SRAM-based FPGAs
• delay difference test
• selective mapping
• highly reliable

This paper presents a butterfly physically unclonable PUF) implementation in SRAM-based field programmable gate arrays (FPGAs). To avoid output instability, we propose a delay difference test to identify reliable slices (mapped to which butterfly PUF cells are highly reliable) and then PUF reliability is significantly improved by selective mapping PUF cells to reliable slices, which is validated in experimental results.

• 出版日期2017-7-25
• 单位合肥工业大学