科研之友
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摘要
Performance degradation tolerance (PDT) has been shown to be able to effectively improve the yield, reliability, and lifetime of an electronic product. The focus of PDT is on the particular performance degrading faults (pdef) that only incur some performance degradation of a system without inducing any computation errors. The basic idea is that as long as the defective chips containing only the pdef can provide acceptable performance for some applications, they may still be marketable. Critical issues of PDT to be addressed include the portion of the pdef in a faulty chip and their induced performance degradation. For a typical cache design, most of the possible faults are not pdef. In this brief, we propose a cache redesign method, called PDT cache, where all functional faults in the data-storage cells of a cache (major part of the cache) can be transformed into pdef. By transforming this large number of faults into pdef, a faulty cache becomes much more likely to be still marketable. The proposed design exploits the existing hardware resources and the inherent error resilience scheme to reduce the incurred hardware overhead. The logic synthesis results show that the incurred hardware overhead is only 6.29% for a 32-kB cache. We also evaluate the induced performance degradation under various fault densities using the CPU2000 and CPU2006 benchmark programs. The results show that for a 32-kB cache design, when the fault density is <1%, only 0.31% performance degradation is incurred. In addition, the scalability of the PDT cache is also evaluated. The results show that a smaller hardware overhead is required for a larger cache, and the performance degradation is independent of the cache associativity and can even be smaller for a larger cache under a given fault density.
- 出版日期2016-2
- 单位中山大学
