Height drift correction in non-raster atomic force microscopy

作者：Meyer Travis R; Ziegler Dominik; Brune Christoph; Chen Alex; Farnham Rodrigo; Nen Huynh; Chang Jen Mei; Bertozzi Andrea L; Ashby Paul D^*

来源：Ultramicroscopy, 2014, 137: 48-54.

DOI：10.1016/j.ultramic.2013.10.014

• Atomic force microscopy
• Self-intersecting scan
• Drift correction
• Non-raster scan

We propose a novel method to detect and correct drift in non-raster scanning probe microscopy. In conventional raster scanning drift is usually corrected by subtracting a fitted polynomial from each scan line, but sample tilt or large topographic features can result in severe artifacts. Our method uses self intersecting scan paths to distinguish drift from topographic features. Observing the height differences when passing the same position at different Limes enables the reconstruction of a continuous function of drift. We show that a small number of self intersections is adequate for automatic and reliable drift correction. Additionally, we introduce a fitness function which provides a quantitative measure of drift correctability for any arbitrary scan shape.

• 出版日期2014-2