A nonlinearity error calibration technique for pipelined ADCs

作者:Jalili Armin*; Sayedi Sayed Masoud; Wikner J Jacob; Nezhad Abolghasem Zeidaabadi
来源:Integration, the VLSI Journal, 2011, 44(3): 229-241.
DOI:10.1016/j.vlsi.2011.01.004

摘要

This paper presents a digital background calibration technique that measures and cancels offset, linear and nonlinear errors in each stage of a pipelined analog to digital converter (ADC) using a single algorithm. A simple two-step subranging ADC architecture is used as an extra ADC in order to extract the data points of the stage-under-calibration and perform correction process without imposing any changes on the main ADC architecture which is the main trend of the current work. Contrary to the conventional calibration methods that use high resolution reference ADCs, averaging and chopping concepts are used in this work to allow the resolution of the extra ADC to be lower than that of the main ADC.

  • 出版日期2011-6