Low-Cost Memory Fault Tolerance for IoT Devices

作者：Gottscho Mark^*; Alam Irina; Schoeny Clayton; Dolecek Lara; Gupta Puneet

来源：ACM Transactions on Embedded Computing Systems, 2017, 16(5s): 128.

DOI：10.1145/3126534

• Scratchpad memory
• fault tolerance
• ECC
• IoT
• defects
• soft errors
• approximate computing

IoT devices need reliable hardware at low cost. It is challenging to efficiently cope with both hard and soft faults in embedded scratchpad memories. To address this problem, we propose a two-step approach: FaultLink and Software-Defined Error-Localizing Codes (SDELC). FaultLink avoids hard faults found during testing by generating a custom-tailored application binary image for each individual chip. During software deployment-time, FaultLink optimally packs small sections of program code and data into fault-free segments of the memory address space and generates a custom linker script for a lazy-linking procedure. During run-time, SDELC deals with unpredictable soft faults via novel and inexpensive Ultra-Lightweight Error-Localizing Codes (UL-ELCs). These require fewer parity bits than single-error-correcting Hamming codes. Yet our UL-ELCs are more powerful than basic single-error-detecting parity: they localize single-bit errors to a specific chunk of a codeword. SDELC then heuristically recovers from these localized errors using a small embedded C library that exploits observable side information (SI) about the application's memory contents. SI can be in the form of redundant data (value locality), legal/illegal instructions, etc. Our combined FaultLink+SDELC approach improves min-VDD by up to 440 mV and correctly recovers from up to 90% (70%) of random single-bit soft faults in data (instructions) with just three parity bits per 32-bit word.

• 出版日期2017-10