Memristor and selector devices fabricated from HfO2-xNx

作者:Murdoch B J; McCulloch D G; Ganesan R; McKenzie D R; Bilek M M M; Partridge J G
来源:Applied Physics Letters, 2016, 108(14): 143504.
DOI:10.1063/1.4945727

摘要

Monoclinic HfO2-xNx has been incorporated into two-terminal devices exhibiting either memristor or selector operation depending on the controlled inclusion/suppression of mobile oxygen vacancies. In HfO2 memristors containing oxygen vacancies, gradual conductance modulation, short-term plasticity, and long-term potentiation were observed using appropriate voltage-spike stimulation, suggesting suitability for artificial neural networks. Passivation of oxygen vacancies, confirmed by X-ray absorption spectroscopy, was achieved in HfO2-xNx films by the addition of nitrogen during growth. Selector devices formed on these films exhibited threshold switching and current controlled negative differential resistance consistent with thermally driven insulator to metal transitions.

  • 出版日期2016-4-4