Nanometer-scale mechanical properties probed by two-dimensional dynamic force spectroscopy with rigid cantilever

作者：Brun M^*; Decossas S; Triozon F; Rannou R; Grevin B

来源：Applied Physics Letters, 2005, 87(13): 133101.

DOI：10.1063/1.1992670

We demonstrate that frequency-modulated atomic force microscopy with a rigid cantilever can be used to image the microphase separation of soft materials, i.e., a polystyrene/poly(methylmethacrylate) block copolymer. Two-dimensional force spectroscopy images reveal a clear contrast originating from local variations in the mechanical properties of the two microsegregated phases. The force versus tip-sample distance dependence is extracted from the frequency shift data and discussed in the frame of the contact forces theories.

• 出版日期2005-9-26
• 单位中国地震局