Dynamic Nanoimpedance Characterization of the Atomic Force Microscope Tip- Surface Contact

作者:Tobiszewski Mateusz Tomasz*; Zielinski Artur; Darowicki Kazimierz
来源:Microscopy and Microanalysis, 2014, 20(1): 72-77.
DOI:10.1017/S1431927613013895

摘要

Nanoimpedance measurements, using the dynamic impedance spectroscopy technique, were carried out during loading and unloading force of a probe on three kinds of materials of different resistivity. These materials were: gold, boron-doped diamond, and AISI 304 stainless steel. Changes of impedance spectra versus applied force were registered and differences in the tip-to-sample contact character on each material were revealed. To enable comparison between materials and phases, a new standardization method is proposed, which simulates conditions of initial contact.

  • 出版日期2014-2

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