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摘要
The effect of nonlinearity of the drift velocity of free charge carriers and the gradient- and concentration-related nonlinearities in the power-voltage sensitivity of a field-effect transistor with a short channel are studied theoretically. Theoretical results are compared with experimental data on the detection of terahertz radiation. It follows from the comparison that, in order to gain deeper insight into observed systematic features in the analysis of high-frequency characteristics of the transistor, one has to take into account some other mechanisms of the current nonlinearity, in addition to the plasma-related nonlinearity.
- 出版日期2008-3
