A CMOS IR-UWB transceiver design for contact-less chip testing applications

作者:Wang Yanjie*; Niknejad Ali M; Gaudet Vincent; Iniewski Kris
来源:IEEE Transactions on Circuits and Systems II-Express Briefs, 2008, 55(4): 334-338.
DOI:10.1109/TCSII.2008.919502

摘要

This paper presents a novel CMOS impulse radio (IR) ultra-wide-band (UWB) transceiver system design for future contact-less chip testing applications using inductive magnetic coupling as wireless interconnect. The proposed architecture is composed of a simple and robust design of a Gaussian Monocycle impulse generator at the transmitter, a wideband short-range on-chip transformer for data transmission, and a g(m)-boosted common-gate low-noise amplifier in the UWB receiver path. SpectreRF post-layout simulation with a 90-nm CMOS technology shows that the transceiver operates up to a 5 Gb/s data rate, and consumes a total of 9 mW under a 1-V power supply.

  • 出版日期2008-4