科研之友
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摘要
Aberration-corrected scanning transmission electron microscopes can now raster Angstrom-sized electron probes across cross sectional foils with interfaces parallel to the incident beam Bright and annular dark field images deliver views of the structural arrangement of the atomic columns across such interfaces In parallel electron energy loss spectroscopy is efficient for recording the electronic response of the specimen with a high level of spatial and energy resolution It thus provides maps atomic column by atomic column, of the nature and in some cases of the bonding state, of the atoms across artificially grown heterolayers for electronics spintronics and photonics components
- 出版日期2010-12
