Analysis of Fe-Si layered structures by reflected electron energy loss spectroscopy and inelastic scattering cross-section

作者：Parshin A S^*; Aleksandrova G A; Varnakov S N; Ovchinnikov S G

来源：Journal of Structural Chemistry, 2009, 50(3): 429-433.

DOI：10.1007/s10947-009-0064-5

• reflected electron energy loss spectroscopy
• inelastic scattering cross-section
• mean length of the inelastic free path of an electron

This paper reports on our study of the formation of an interface of layered structures in the Fe-Si system by reflected electron energy loss spectroscopy (REELS). Quantitative element analysis was performed using the product of the mean length of the inelastic free path by the inelastic scattering cross-section of electrons. It is shown that the Fe-Si interface is quite uniform.

• 出版日期2009-6