A setup for probing ultra-short soft X-ray diffraction by means of curved multilayer structures

作者：Ksenzov D^*; Schlemper Ch; Davtyan A; Bajt S; Schaefers F; Pietsch U

来源：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms , 2011, 269(19): 2124-2129.

DOI：10.1016/j.nimb.2011.07.002

• X-ray spectrograph
• Reflectivity
• Multilayers
• XFEL
• Boron carbide

We propose an experimental setup allowing for measurement of the whole diffraction curve of a Bragg peak by single pulse exposure where a bended sample is illuminated by a set of parallel pencil beams under locally different angles of incidence. The feasibility is demonstrated probing the 1st order Bragg peak of Ru/B(4)C multilayers for photon energies close to Boron K-edge. The evaluated optical parameters recorded from bent sample under fixed sample setting equals those obtained from a flat sample using angular dispersive recording. Subsequently our scheme is appropriate for solid state experiment using at high intense femtosecond pulses provided by free-electron laser sources.

• 出版日期2011-10-1