Microwave surface resistance measurement of hts films using dielectric resonators

作者：Zhang X^*; Yan S L; Ji L; Sun D Y; Zhou T G; Fang L; Zhao X J

来源：Physica C-Superconductivity and Its Applications, 2006, 449(2): 96-99.

DOI：10.1016/j.physc.2006.07.004

• HTS film
• microwave
• surface resistance
• dielectric resonator

An open-ended dielectric resonator method and experimental apparatus for measuring microwave surface resistance of the high T-c superconducting thin films are reported. Making use of two sapphire rods the quality factor related to the losses of the resonator except its superconducting part can be evaluated. The R-s value of an individual superconducting thin film can be determined without any assistance of other superconducting films or calibrators. This measurement provides a convenient and absolute approach for R-s-measurement of high T-c superconducting thin films. Also the error in the R-s-measurement with the method was discussed.

• 出版日期2006-11-15
• 单位南开大学