A Design Strategy of Error-Prediction Low-Density Parity-Check (EP-LDPC) Error-Correcting Code (ECC) and Error-Recovery Schemes for Scaled NAND Flash Memories

作者：Tanakamaru Shuhei^*; Doi Masafumi; Takeuchi Ken

来源：IEICE TRANSACTIONS ON ELECTRONICS, 2015, E98C(1): 53-61.

DOI：10.1587/transele.E98.C.53

• Error-correcting code
• ECC
• low-density parity-check
• LDPC
• NAND flash memory

A design strategy (the required ECC strength and the judgment method of the dominant error mode) of error-prediction low-density parity-check (EP-LDPC) error-correcting code (ECC) and error-recovery schemes for scaled NAND flash memories is discussed in this paper. The reliability characteristics of NAND flash memories are investigated with 1X, 2X and 3Xnm NAND flash memories. Moreover, the system-level reliability of SSDs is analyzed from the acceptable data-retention time of the SSD. The reliability of the NAND flash memory is continuously degrading as the design rule shrinks due to various problems. As a result, future SSDs will not be able to maintain system-level reliability unless advanced ECCs with signal processing are adopted. Therefore, EP-LDPC and error-recovery (ER) schemes are previously proposed to improve the reliability. The reliability characteristics such as the bit-error rate (BER) versus the data-retention time and the effect of the cell-to-cell interference on the BER are measured. These reliability characteristics obtained in this paper are stored in an SSD as a reliability table, which plays a principal role in EP-LDPC scheme. The effectiveness of the EP-LDPC scheme with the scaling of the NAND flash memory is also discussed by analyzing the cell-to-cell interference. An interference factor alpha is proposed to discuss the impact of the cell-to-cell coupling. As a result, the EP-LDPC scheme is assumed to be effective down to 1Xnm NAND flash memory. On the other hand, the ER scheme applies different voltage pulses to memory cells, according to the dominant error mode: program-disturb or data-retention error dominant mode. This paper examines when the error mode changes, corresponding to which pulse should be applied. Additionally, the estimation methods of the dominant error mode by ER scheme are also discussed. Finally, as a result of the system-level reliability analysis, it is concluded that the use of the EP-LDPC scheme can maintain the reliability of the NAND flash memory in 1Xnm technology node.

• 出版日期2015-1