摘要

In this article a new method for yield optimization (design centring) is introduced. The method has a statistical-geometrical nature, hence it is called hybrid. The method exploits the semi-definite programming applications in approximating the feasible region with two bounding ellipsoids. These ellipsoids are obtained using a two phase algorithm. In the first phase, the minimum volume ellipsoid enclosing the feasible region is obtained. The largest ellipsoid that can be inscribed inside the feasible region is obtained in the second phase. The centres of these bounding ellipsoids are used as design centres. In the second phase, an additional polytopic region approximation is constructed. A comparison between the obtained region approximations is given. Saving in the number of circuit simulations needed for yield optimization is also considered. Practical examples are given to show the effectiveness of the new method.

  • 出版日期2012