An X-ray diffractometer using mirage diffraction

作者:Fukamachi Tomoe*; Jongsukswat Sukswat; Ju Dongying; Negishi Riichirou; Hirano Keiichi; Kawamura Takaaki
来源:JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2014, 47(4): 1267-1272.
DOI:10.1107/S1600576714012114

摘要

Some characteristics are reported of a triple-crystal diffractometer with a (+, -, +) setting of Si(220) using mirage diffraction. The first crystal is flat, while the second and third crystals are bent. Basically, the first crystal is used as a collimator, the second as a monochromator and the third as the sample. The third crystal also works as an analyzer. The advantages of this diffractometer are that its setup is easy, its structure is simple, the divergence angle from the second crystal is small and the energy resolution of the third crystal is high, of the order of sub-meV.

  • 出版日期2014-8