Dynamic response of a cracked atomic force microscope cantilever used for nanomachining

作者：Lee Haw Long; Chang Win Jin^*

来源：Nanoscale Research Letters, 2012, 7: 131.

DOI：10.1186/1556-276X-7-131

• atomic force microscope
• cracked cantilever
• nanomachining
• vibration response1

The vibration behavior of an atomic force microscope [AFM] cantilever with a crack during the nanomachining process is studied. The cantilever is divided into two segments by the crack, and a rotational spring is used to simulate the crack. The two individual governing equations of transverse vibration for the cracked cantilever can be expressed. However, the corresponding boundary conditions are coupled because of the crack interaction. Analytical expressions for the vibration displacement and natural frequency of the cracked cantilever are obtained. In addition, the effects of crack flexibility, crack location, and tip length on the vibration displacement of the cantilever are analyzed. Results show that the crack occurs in the AFM cantilever that can significantly affect its vibration response.
PACS: 07.79.Lh; 62.20.mt; 62.25.Jk.

• 出版日期2012-2-15