A program for phase identification using diffractograms obtained from TEM structure images

作者：Galicia R^*; Herrera R; Rius J L; Zorrilla C; Gomez A

来源：Revista Mexicana de Fisica, 2013, 59(2): 102-106.

• Electron microscopy
• X-ray diffraction
• difractograms
• indexing

In this work a computer program for the indexing of diffractograms is presented. The diffractograms are obtained by means of a discrete Fourier transform from high resolution electron microscope images. The program requires the use of x-ray diffraction data files together with a fast Fourier transform program, for this purpose we used the Digital Micrograph software.

• 出版日期2013-4