Accurate evaluation of the far field error of the semiconductor laser

作者:Cao Chang Qing; Wang Ting*; Zeng Xiao Dong; Feng Zhe Jun; Zhang Wen Rui; Zhang Xiao Bing; Chen Kun
来源:Optik, 2018, 156: 69-74.
DOI:10.1016/j.fileo.2017.10.172

摘要

For practical application, it is of importance to provide a precise description of the far field error on the basis of the source error. The "relative error volume", instead of the local error, of the source is put forward to give the maximum error range of the far field error. In order to determine the off-center source error, the "critical point" of the far field phase error is obtained, dealt with and raised. Numerical results given are used to check up this method. It is indicated that the "off-center distance" together with the "relative error volume" should be used in describing the source error and analyzing the far field error, and the "critical points" is a useful parameter to analyze the source error for the inverse problem.

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