A universal scaling law for the strength of metal micropillars and nanowires

作者：Dou R; Derby B^*

来源：Scripta Materialia, 2009, 61(5): 524-527.

DOI：10.1016/j.scriptamat.2009.05.012

• Nanocrystalline materials
• Plastic deformation
• Size effect

The yield strength of sub-micron single-crystal metal pillars and wires increases with decreasing pillar diameter. Here, we show that the yield stress (resolved onto a slip system), sigma(rss), scaled by shear modulus, p, and the diameter, d, scaled by Burgers vector, b, shows the following universal correlation: sigma(rss)/mu = A(d/b)(m); for face-centred cubic (fcc) metals A = 0.71 and m = -0.66. Data for Mo and a Mo alloy are found to approximately obey the fcc correlation, despite having a different crystal structure.

• 出版日期2009-9