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摘要
The article presents an efficient method for characterization of substrate integrated waveguide structures. Substrate integrated circuits are considered as an ensemble of conducting vias placed in a parallel-plate waveguide. The analysis is based oil the wave concept formulation and the iterative resolution of two relationships between incident and reflected volume-waves. The reflection operator is expressed using Hankel functions and computed by considering the scattering front the ensemble of conducting posts. Numerical results have been obtained for substrate integrated waveguide (SIW) structures already presented in literature. Simulations obtained are compared with recent published results. A good agreement is achieved together with significant improvements both in computational tithe and memory requirements.
- 出版日期2010-1
