A New Built-in TPG Based on Berlekamp-Massey Algorithm

作者：de Souza Cleonilson Protasio^*; de Assis Francisco Marcos; Silverio Freire Raimundo Carlos

来源：Journal of Electronic Testing-Theory and Applications, 2010, 26(4): 443-451.

DOI：10.1007/s10836-010-5155-x

• BIST
• Mixed-mode TPG
• LFSR
• Berlekamp-Massey algorithm

In this work, a new method to design a mixed-mode Test Pattern Generator (TPG) based only on a simple and single Linear Feedback Shift Register (LFSR) is described. Such an LFSR is synthesized by Berlekamp-Massey algorithm (BMA) and is capable of generating pre-computed deterministic test patterns which detect the hard-to-detect faults of the circuit. Moreover, the LFSR generates residual patterns which are sufficient to detect the remaining easy-to-detect faults. In this way, the BMA-designed LFSR is a mixed-mode TPG which achieves total fault coverage with short testing length and low hardware overhead compared with previous schemes according to the experimental results.

• 出版日期2010-8