作者：Hasan Md Rezaul; Arinze Ebuka S; Singh Arunima K; Oleshko Vladimir P; Guo Shiqi; Rani Asha; Cheng Yan; Kalish Irina; Zaghloul Mona E; Rao Mulpuri V; Nguyen Nhan V; Motayed Abhishek; Davydov Albert V; Thon Susanna M*; Debnath Ratan*
来源：Advanced Electronic Materials, 2016, 2(9): 1600182.
DOI：10.1002/aelm.201600182
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