Development and performance evaluation of read-out electronics system for high resolution X-ray detector

作者：Zhang Hong Kai; Feng Zhao Dong; Li Xiao Hui; Du Qiu Yu; Wei Shu Jun; Liu Shuang Quan; Qin Xiu Bo; Wei Cun Feng; Wei Long

来源：Atomic Energy Science and Technology, 2015, 49(3): 534-539.

DOI：10.7538/yzk.2015.49.03.0534

• Cooling temperature
• Dark current noise
• Digital signal-processing circuits
• Electronics system
• Front-end processing
• Readout Electronics
• Spatial resolution
• X-ray detector

An electronics system was developed according to the low noise requirement of FOT X‐ray detector in this paper .The electronics system consists of an analog drive circuit ,a front end processing circuit and a digital signal processing circuit w hich is based on field programmable gate array (FPGA ) . The performance of FOT X‐ray detector was evaluated on the X‐ray imaging platform . The overall system gain is 0.168 6 DN/e- ,and the linear operating range of the detector is 0‐154 μGy .When the cooling temperature reaches -20 ℃ ,the dark current noise is 0.037 e- /(pixel · s) and the read noise is 10.9 e- .The intrinsic spatial resolution of the detector is 16 lp/mm . The results indicate that the designed read‐out electronics system meets the require‐ments of high resolution X‐ray detector .

• 出版日期2015-3-20
• 单位中国科学院大学; 核探测与核电子学国家重点实验室