摘要
We propose a compact model of drain current in the ballistic and quasi-ballistic modes for cylindrical gate-all-around (GAA)-MOSFETs with two subbands based on the perturbation theory. By setting one unknown parameter, we can use it to express surface potential and electron confinement energy levels to calculate drain current analytically. With our compact model, we obtained a good agreement with the numerical compact model. In addition, we carry out a NMOS inverter circuit simulation using this model.
- 出版日期2013-4