An electrical switching device controlled by a magnetic field-dependent impact ionization process

作者:Lee Jinseo*; Joo Sungjung; Kim Taeyueb; Kim Ki Hyun; Rhie Kungwon; Hong Jinki; Shin Kyung Ho
来源:Applied Physics Letters, 2010, 97(25): 253505.
DOI:10.1063/1.3532105

摘要

An abrupt change of conductance at a threshold magnetic field was observed in a device consisting of a nonmagnetic narrow-gap semiconductor. The conductance varies more than 25 times as the magnetic field increases. The threshold magnetic field can be tuned using a bias voltage from zero to several hundred Gauss. This large magnetoconductance effect is caused by the magnetic field-dependent impact ionization process. A theoretical model is proposed, and calculations based on this model simulate the experimental results closely. This device may be a good candidate for an electrical switching device controlled by a magnetic field.

  • 出版日期2010-12-20