Nanoscale study of perovskite BiFeO3/spinel (Fe,Zn)(3)O-4 co-deposited thin film by electrical scanning probe methods

作者：Borowiak Alexis S^*; Okada Koichi; Kanki Teruo; Gautier Brice; Vilquin Bertrand; Tanaka Hidekazu

来源：Applied Surface Science, 2015, 351: 531-536.

DOI：10.1016/j.apsusc.2015.05.177

• Piezoresponse force microscopy
• Conductive atomic force microscopy
• Local piezoelectric hysteresis loops
• Co-deposited thin film
• BiFeO3
• (Fe,Zn)(3)O-4

For this study, a BiFeO3 (BFO) perovskite/(Fe,Zn)(3)O-4 (FZO) spinel sample grown on SrTiO3 : Nb (001) has been prepared using pulsed laser deposition with a single target composition of (Bi1.1FeO3)(0.65)(Fe2.2Zn0.8O4)(0.35) The nanoscale electrical properties of ferroelectric BFO/semi-conducting FZO thin film have been investigated using piezoresponse force microscopy (PFM) and conductive-atomic force microscopy (C-AFM). Scanning probe methods reveal that BFO grows as nano-islets with a complex structure which is coherent with the cross-sectional high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) images. The comparison between nanoscale electrical techniques and HAADF-STEM images have allowed to understand the origin of the different physical properties of the multiferroic/magnetoconductive co-deposited thin film at the nanoscale. By using PFM/C-AFM techniques, we were able to fully distinguish BFO and FZO materials in the nanostructured sample without using destructive material characterization methods.

• 出版日期2015-10-1