Comparison of single-event upset generated by heavy ion and pulsed laser

作者：Liang, Bin^*; Song, Ruiqiang; Han, Jianwei; Chi, Yaqing; Chen, Rui; Hu, Chunmei; Chen, Jianjun; Ma, Yingqi; Shangguan, Shipeng

来源：Science China Information Sciences, 2017, 60(7): 072401.

DOI：10.1007/s11432-016-0346-1

• single-event upset
• charge sharing
• cross sections
• heavy ion
• pulsed laser

Single-event upset (SEU) is investigated using heavy ion and pulsed laser. The measured SEU cross sections of D and DICE flip-flops are compared. Measurement results indicate pulsed laser is capable of inducing similar SEU to those induced by heavy ion. 3D-TCAD simulation is performed to investigate the factors to impact pulsed laser induced SEU. Simulation results show that the beam spot size significantly impacts SEU cross sections in both low and high laser energy while the variation of the equivalent LET only impacts SEU cross sections in the low laser energy.

• 出版日期2017-7
• 单位中国科学院国家空间科学中心; 中国人民解放军国防科学技术大学