A Low-Cost Power-Quality Meter With Series Arc-Fault Detection Capability for Smart Grid

作者：Koziy Kostyantyn^*; Gou Bei; Aslakson Joel

来源：IEEE Transactions on Power Delivery, 2013, 28(3): 1584-1591.

DOI：10.1109/TPWRD.2013.2251753

• Arc fault
• Goertzel algorithm
• microcontroller
• power quality (PQ)
• smart meter
• total harmonic distortion (THD)
• wavelet

This paper presents a low-cost digital single-phase power-quality measurement device for consumer use with a wide range of features, including series arc-fault detection, load trip on failure, and phase/neutral line wiring mix up indication. A wavelet multiresolution analysis technique was utilized for the voltage transient event detection and the current drop pattern recognition, specifically to arc fault. The last feature also involved the use of adaptive thresholding, peak detection, and repetition frequency calculation. A computationally efficient and accurate Goertzel filter was used for total harmonic distortion calculation. In addition, this meter can measure phase fundamental frequency (using the zero-crossing technique), rms values, and power. MATLAB and MathCAD packages were used to build and simulate arc-fault model and phase voltage distortion, to design and test part of the developed algorithms, which were further implemented in Embedded C and Assembler programming languages. A prototype circuit board with the required sensors and relay, analog isolation, indication, user controls, communication link, and a low-cost microchip microcontroller (MCU) dsPIC33 was designed and built to validate implemented algorithms and conduct experiments.

• 出版日期2013-7