Organic Field-Effect-Transistor-Based Memory with Nylon 11 as Gate Dielectric

作者:Sakai Heisuke*; Isoda Hayato; Furukawa Yukio
来源:Japanese Journal of Applied Physics, 2012, 51(4): 040210.
DOI:10.1143/JJAP.51.040210

摘要

We present the electrical properties of an organic memory device based on an organic field-effect transistor using a thin film of nylon 11 as a gate dielectric. The transfer characteristics of the memory device showed large hysteresis. A large shift of 37 V in the transfer characteristics was obtained by the application of a writing bias to the gate dielectric. The drain current ratio of the on-state to off-state was ca. 100. The on-state of the memory device showed a clear memory characteristic.

  • 出版日期2012-4