A compact RF CMOS modeling for accurate high-frequency noise simulation in sub-100-nm MOSFETs

作者：Guo Jyh Chyurn^*; Lin Yi Min

来源：IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2008, 27(9): 1684-1688.

DOI：10.1109/TCAD.2008.927736

• lossy substrate de-embedding
• radio frequency (RF) complementary metal-oxide-semiconductor (CMOS) model
• short-channel effect (SCE)
• thermal noise model

A compact RF CMOS model incorporating an improved thermal noise model is developed. Short-channel effects (SCEs), substrate potential fluctuation effect, and parasitic-resistance-induced excess noises were implemented in analytical formulas to accurately simulate RF noises in sub-100-nm MOSFETs. The intrinsic noise extracted through a previously developed lossy substrate de-embedding method and calculated by the improved noise model can consistently predict gate length scaling effects. For 65- and 80-nm n-channel MOS with f(T) above 160 and 100 GHz, NF(min) at 10 GHz can be suppressed to 0.5 and 0.7 dB, respectively. Drain current noise S(id) reveals an apparently larger value for 65-nm devices than that for 80-nm devices due to SCE. On the other hand, the shorter channel helps reduce the gate current noise S(ig) attributed to smaller gate capacitances. Gate resistance R(g)-induced excess noise dominates in S(ig) near one order higher than the intrinsic gate noise that is free from R(g) for 65-nm devices. The compact RF CMOS modeling can facilitate high-frequency noise simulation accuracy in nanoscale RF CMOS circuits for low-noise design.

• 出版日期2008-9
• 单位中国科学院电工研究所