A 0.003-mm(2), 0.35-V, 82-pJ/conversion ultra-low power CMOS all digital temperature sensor for on-die thermal management

作者：Kim Yongtae^*; Li Peng

来源：Analog Integrated Circuits and Signal Processing, 2013, 75(1): 147-156.

DOI：10.1007/s10470-012-9988-3

• Temperature sensor
• Time-to-digital converter (TDC)
• All digital sensor
• Subthreshold
• Ultra-low power
• Two-point calibration

In this paper, a 0.35 V, 82 pJ/conversion ring oscillator based ultra-low power CMOS all digital temperature sensor is presented for on-die thermal management. We utilize subthreshold circuit operation to reduce power and adopt an all-digital architecture, consisting of only standard digital gates. Additionally, a linearization technique is proposed to correct the nonlinear characteristics of subthreshold MOSFETs. A bulk-driven 1-bit gated digitally controlled oscillator is designed for the temperature sensing node. Also, a 1-bit time-to-digital converter is employed in order to double the fine effective resolution of the sensor. The proposed digital temperature sensor has been designed in a 90-nm regular V (T) CMOS process. After a two-point calibration, the sensor has a maximum error of -0.68 to +0.61 A degrees C over the operating temperature range from 0 to 100 A degrees C, while the effective resolution reaches 0.069 A degrees C/LSB. Under a supply voltage of 0.35 V, the power dissipation is only 820 nW with the conversion rate of 10K samples/s at room temperature. Also, the sensor occupies a small area of 0.003 mm(2).

• 出版日期2013-4