Comparative studies on solder joint reliability of CTBGA assemblies with various adhesives using the array-based package shear test

作者：Shi Hongbin^*; Ueda Toshitsugu

来源：Microelectronics Reliability, 2011, 51(9-11): 1898-1902.

DOI：10.1016/j.microrel.2011.07.034

This paper discusses the influences of various adhesives on board-level shear strength of ChipArray (R) Thin Core Ball Grid Array (CTBGA) assemblies through an innovative reliability evaluation approach, i.e. array-based package (ABP) shear test. It is found that the adhesives do enhance the shear strength for all the test categories as compared with the assemblies without adhesives (w/o A), but the degree of improvements between different strategies vary quiet a lot. The specific shear strength is affected by a number of factors, in which dispending patterns and material properties of the adhesives used influences it obviously. In general, the adhesives with high storage modulus and large dispensing volume are preferred, for example, stiff full or partial capillary flow underfills. In order to further understand the failure mechanism of the CTBGA during the ABP shear test, failure analysis on tested devices are also conducted using side view optical microscopy, scanning electron microscope (SEM) and energy dispersive X-ray (EDX), the results indicate that the predominant failure mode changes from PCB pad lift/cratering to fracture at package side intermetallic compound (IMC)/solder interface with increasing dispensing volume and storage modulus, which basically improves the solder joint reliability of CTBGA assemblies.

• 出版日期2011-11